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Analyses of Interfaces in Wafer-Bonded Tandem Solar Cells by Aberration-Corrected STEM and EELS

Published online by Cambridge University Press:  27 August 2014

Dietrich Häussler ,
Lothar Houben ,
Rafal E. Dunin-Borkowski ,
Stephanie Essig ,
Frank Dimroth  and
Wolfgang Jäger
Dietrich Häussler
Affiliation:
Institute for Materials Science, Christian Albrechts University Kiel, Kaiserstraße 2, 24143 Kiel, Germany
Lothar Houben
Affiliation:
Ernst Ruska Centre for Microscopy and Spectroscopy with Electrons, Research Centre Juelich GmbH, 52425 Juelich, Germany
Rafal E. Dunin-Borkowski
Affiliation:
Ernst Ruska Centre for Microscopy and Spectroscopy with Electrons, Research Centre Juelich GmbH, 52425 Juelich, Germany
Stephanie Essig
Affiliation:
Fraunhofer Institute for Solar Energy Systems ISE, Heidenhofstraße 2, 79110 Freiburg, Germany
Frank Dimroth
Affiliation:
Fraunhofer Institute for Solar Energy Systems ISE, Heidenhofstraße 2, 79110 Freiburg, Germany
Wolfgang Jäger
Affiliation:
Institute for Materials Science, Christian Albrechts University Kiel, Kaiserstraße 2, 24143 Kiel, Germany

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 456 - 457
Copyright
Copyright © Microscopy Society of America 2014 

References

[1] Howlader, M M R, et al., Electrochemical and Solid-State Letters, 13 (2010), p. H61.Google Scholar
[2] Chung, T R, et al., Nuclear Instruments and Methods in Physics Research B I2 (1997), p. 203.Google Scholar
[3] Häussler, D, et al., in Proc. 15th European Microscopy Congress (2012). ed. D J Stokes, W M Rainforth, The Royal Microscopical Society (2012, London) Vol. 1, p. 95.Google Scholar
[4] Häussler, D, et al., Ultramicroscopy, 134 (2013) p. 55.Google Scholar