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An Electron Microscopic Investigation of (1/3) < 0ī11 > Dislocations in Bi2Te3 Nanowires: Defect Crystallography and Relationship to 7-layer Bi3Te4 Defects.

Published online by Cambridge University Press:  27 August 2014

D.L. Medlin
Affiliation:
Sandia National Laboratories, Livermore, CA 94551, USA
K.J. Erickson
Affiliation:
Sandia National Laboratories, Livermore, CA 94551, USA
S.J. Limmer
Affiliation:
Sandia National Laboratories, Albuquerque, NM 87185, USA
W.G. Yelton
Affiliation:
Sandia National Laboratories, Albuquerque, NM 87185, USA
M.P. Siegal
Affiliation:
Sandia National Laboratories, Albuquerque, NM 87185, USA

Abstract

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Type
Abstract
Copyright
Copyright © Microscopy Society of America 2014 

References

Hicks, L.D. & Dresselhaus, M.S. Phys. Rev. B 47 (24) (1993)16631.Google Scholar
Limmer, S.J, et al., J. Electrochem. Soc. 159 (4) (2012)D235. doi: 10.1149/2.084204jes.Google Scholar
Siegal, M.P., et al., J. Materials Research 29(2) (2014)182. doi: 10.1557/jmr.2013.370.Google Scholar
Medlin, D.L., et al., J. Materials Science, in press (2014).doi: 10.1007/s10853-014-8035-4.Google Scholar
Sandia National Laboratories is a multi-program laboratory managed and operated by SandiaCorporation, a wholly owned subsidiary of Lockheed Martin Corporation, for the U.S. Department ofEnergy’s National Nuclear Security Administration under contract DE-AC04-94AL85000.Google Scholar