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An Atomic Level Study of Localized Strain Fields on Multiple Low-Index Ceria (CeO2) Nanoparticle Surfaces
Published online by Cambridge University Press: 30 July 2021
Abstract
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- Type
- Defects in Materials: How We See and Understand Them
- Information
- Copyright
- Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America
References
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We gratefully acknowledge support of NSF grant DMR-1308085, DOE BES DE-SC0004954, the use of ASU's John M. Cowley Center for High Resolution Electron Microscopy and use of the K2 IS camera courtesy of Gatan.Google Scholar
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