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Amplitude Contrast Imaging: High Resolution Electron Microscopy Using a Spherical and Chromatic Aberration Corrected TEM

Published online by Cambridge University Press:  27 August 2014

J.G. Wen ,
D.J. Miller ,
R.E. Cook  and
N.J. Zaluzec
J.G. Wen
Affiliation:
Electron Microscopy Center, Argonne National Laboratory, IL 60439 USA
D.J. Miller
Affiliation:
Electron Microscopy Center, Argonne National Laboratory, IL 60439 USA
R.E. Cook
Affiliation:
Electron Microscopy Center, Argonne National Laboratory, IL 60439 USA
N.J. Zaluzec
Affiliation:
Electron Microscopy Center, Argonne National Laboratory, IL 60439 USA

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 942 - 943
Copyright
Copyright © Microscopy Society of America 2014 

References

[1] Jia, C. L., Lentzen, M. & Urban, K. Science 299, 870–873 (2003).Google Scholar
[2] Wang, A., Chen, F. R., Van Aert, S. & Van Dyck, D. Ultramicroscopy 110,527–534 (2010).Google Scholar
[3] Research at the Electron Microscopy Center at Argonne National Laboratory is supported by theU.S. Department of Energy, Office of Science, Office of Basic Energy Sciences, under Contract No. DE-AC02-06CH11357.Google Scholar