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Advances in High-Resolution X-Ray Computed Tomography: Comparing the Latest in Cabinet-based Micro-Computed Tomography Technologies and Synchrotron Radiation-Based Tomography Beamlines

Published online by Cambridge University Press:  23 November 2012

R. Rudolph ,
A. Williams  and
O. Brunke
R. Rudolph
Affiliation:
GE Inspection Technologies, Lewistown, PA
A. Williams
Affiliation:
GE Inspection Technologies, Lewistown, PA
O. Brunke
Affiliation:
GE Sensing & Inspection Technologies GmbH, Wunstorf, Germany
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Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Type
Research Article
Information
Microscopy and Microanalysis , Volume 18 , Issue S2: Proceedings of Microscopy & Microanalysis 2012 , July 2012 , pp. 576 - 577
Copyright
Copyright © Microscopy Society of America 2012

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