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Advances in Extreme-Scale 3D EM: Specimen Preparation and Recording Systems for Electron Microscopic Tomography and Serial Block Face SEM

Published online by Cambridge University Press:  08 April 2017

M Ellisman ,
T Deerinck ,
E Bushong ,
J Bouwer ,
T Shone ,
L Jin ,
A Milazzo ,
S Peltier  and
N-H Xuong
M Ellisman
Affiliation:
University of California, San Diego
T Deerinck
Affiliation:
University of California, San Diego
E Bushong
Affiliation:
University of California, San Diego
J Bouwer
Affiliation:
University of California, San Diego
T Shone
Affiliation:
University of California, San Diego
L Jin
Affiliation:
University of California, San Diego
A Milazzo
Affiliation:
University of California, San Diego
S Peltier
Affiliation:
University of California, San Diego
N-H Xuong
Affiliation:
University of California, San Diego

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 17 , Supplement S2 , July 2011 , pp. 976 - 977
Copyright
Copyright © Microscopy Society of America 2011