Hostname: page-component-586b7cd67f-tf8b9 Total loading time: 0 Render date: 2024-11-27T04:35:19.822Z Has data issue: false hasContentIssue false
  • English
  • Français

Advancements of Evactron® Plasma Cleaning of Moxtek® X-ray Windows

Published online by Cambridge University Press:  05 August 2019

Ewa Kosmowska ,
Michael Almond ,
Josh Wong ,
Brian Law ,
Barbara Armbruster  and
Ronald Vane
Ewa Kosmowska*
Affiliation:
XEI Scientific, Inc., Redwood City, CA, USA.
Michael Almond
Affiliation:
Moxtek Inc., Orem, UT, USA.
Josh Wong
Affiliation:
Moxtek Inc., Orem, UT, USA.
Brian Law
Affiliation:
Moxtek Inc., Orem, UT, USA.
Barbara Armbruster
Affiliation:
XEI Scientific, Inc., Redwood City, CA, USA.
Ronald Vane
Affiliation:
XEI Scientific, Inc., Redwood City, CA, USA.
*
*Corresponding author: [email protected]

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Vendor Symposium
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 556 - 557
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Kosmowska, E et al. , Microsc. Microanal. 23 (S1) (2017), p. 74.Google Scholar
[2]Vane, R and Moore, CA, Microsc. Microanal. 20 (S3) (2014), p. 2014.Google Scholar
[3]Kosmowska, E et al. , Microsc. Microanal. 24 (S1) (2018), p. 682.Google Scholar
[4]Vane, R et al. , Microsc. Microanal. 10 (S2) (2004), p. 966.Google Scholar