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Advanced X-ray phase-contrast and dark-field imaging with the unified modulated pattern analysis (UMPA)

Published online by Cambridge University Press:  10 August 2018

Marie-Christine Zdora ,
Pierre Thibault ,
Hans Deyhle ,
Joan Vila-Comamala ,
Willy Kuo ,
Christoph Rau  and
Irene Zanette
Marie-Christine Zdora*
Affiliation:
Diamond Light Source, Harwell Science and Innovation Campus, Didcot, United Kingdom Department of Physics & Astronomy, University College London, London, United Kingdom
Pierre Thibault
Affiliation:
Department of Physics & Astronomy, University of Southampton, Southampton, United Kingdom
Hans Deyhle
Affiliation:
Department of Physics & Astronomy, University of Southampton, Southampton, United Kingdom
Joan Vila-Comamala
Affiliation:
Institute for Biomedical Engineering, ETH Zurich, Zurich, Switzerland
Willy Kuo
Affiliation:
Institute of Physiology, University of Zurich, Zurich, Switzerland
Christoph Rau
Affiliation:
Diamond Light Source, Harwell Science and Innovation Campus, Didcot, United Kingdom
Irene Zanette
Affiliation:
Diamond Light Source, Harwell Science and Innovation Campus, Didcot, United Kingdom
*
*Corresponding author, [email protected]

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 24 , Supplement S2: Proceedings of the 14th International Conference on X-ray Microscopy (XRM2018) , August 2018 , pp. 20 - 21
Copyright
© Microscopy Society of America 2018 

References

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[4] Zdora, M-C, et al, Phys. Rev. Lett. 118 2017 203903.Google Scholar
[5] Zdora, M-C, et al, Opt. Express 26 2018) p. 4989–5004.Google Scholar
[6] The authors acknowledge T. Zhou (Diamond), F. Koch (LMN/PSI), J. Romell (KTH), S. Sala (UCL, Diamond), A. Last (IMT/KIT), Y. Ohishi (JASRI), and N. Hirao (JASRI) for their contributions.Google Scholar