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Advanced Window Grids for Work at the Intersection of Electron and Optical Imaging

Published online by Cambridge University Press:  08 April 2017

C Striemer  and
T Gaborski
C Striemer
Affiliation:
Simpore, Inc
T Gaborski
Affiliation:
Simpore, Inc

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 17 , Supplement S2 , July 2011 , pp. 1214 - 1215
Copyright
Copyright © Microscopy Society of America 2011