No CrossRef data available.
Article contents
Adjustment to the Light Element Areal Concentration Calculation for Neutron Depth Profiles
Published online by Cambridge University Press: 30 July 2021
Abstract
An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
- Type
- Many Detectors Make Lights Work: Advances in Microanalysis of Light Elements in Synthetic and Natural Materials
- Information
- Copyright
- Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America
References
Downing, R.G. Neutron Depth Profiling Chambers, Reactions of Interest. [Web page] 2018 Oct 24, 2018, 9:51 AM [cited 2018 Nov. 5]; Available from: https://sites.google.com/site/nistndp/home.Google Scholar
Lamaze, G.P., et al. , Neutron depth profiling with the new NIST cold neutron source. Surface and Interface Analysis: An International Journal devoted to the development and application of techniques for the analysis of surfaces, interfaces and thin films, 1997. 25(3): p. 217-220.Google Scholar
Biersack, J., et al. , The use of neutron induced reactions for light element profiling and lattice localization. Nuclear instruments and Methods, 1978. 149(1-3): p. 93-97.CrossRefGoogle Scholar
Nagpure, S.C., et al. , Neutron depth profiling technique for studying aging in Li-ion batteries. Electrochimica Acta, 2011. 56(13): p. 4735-4743.CrossRefGoogle Scholar
Downing, R., et al. , The measurement of boron at silicon wafer surfaces by neutron depth profiling. MRS Online Proceedings Library Archive, 1989. 166.CrossRefGoogle Scholar
Gilliam, S., et al. , Retention and surface blistering of helium irradiated tungsten as a first wall material. Journal of nuclear materials, 2005. 347(3): p. 289-297.CrossRefGoogle Scholar
Nitta, N., et al. , Li-ion battery materials: present and future. Materials today, 2015. 18(5): p. 252-264.Google Scholar
Nebel, C.E., From gemstone to semiconductor. Nature Materials, 2003. 2(7): p. 431-432.CrossRefGoogle Scholar
Ziegler, J., SRIM/TRIM code. 2008.Google Scholar
Vandervorst, W., Shepherd, F., and Downing, R., High resolution SIMS and neutron depth profiling of boron through oxide–silicon interfaces. Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films, 1985. 3(3): p. 1318-1321.CrossRefGoogle Scholar
Ziegler, J., Biersack, J., and Ziegler, M., SRIM: The Stopping and Range of Ions in Matter. 5 ed. 2015, Chester, MD: SRIM Co.Google Scholar
Chen-Mayer, H., et al. , Two aspects of thin film analysis: boron profile and scattering length density profile. Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 2003. 505(1-2): p. 531-535.CrossRefGoogle Scholar
You have
Access