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Adjusting the STEM Sample Holder Potential for Improved EBIC Contrast

Published online by Cambridge University Press:  05 August 2019

Matthew Mecklenburg ,
William A. Hubbard ,
Ho Leung Chan  and
B. C. Regan
Matthew Mecklenburg*
Affiliation:
Core Center of Excellence in Nano Imaging, University of Southern California, Los Angeles, USA.
William A. Hubbard
Affiliation:
Department of Physics and Astronomy, University of California, Los Angeles, USA. California NanoSystems Institute, University of California, Los Angeles, USA.
Ho Leung Chan
Affiliation:
Department of Physics and Astronomy, University of California, Los Angeles, USA. California NanoSystems Institute, University of California, Los Angeles, USA.
B. C. Regan
Affiliation:
Department of Physics and Astronomy, University of California, Los Angeles, USA. California NanoSystems Institute, University of California, Los Angeles, USA.
*
*Corresponding author: [email protected]

Abstract

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Type
Applications of Integrated Electron Probe Microscopy and Microanalysis Techniques in Characterizing Natural and Synthetic Materials
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 2354 - 2355
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Hubbard, WA et al. , Physical Review Applied 10 (2018), 044066.Google Scholar
[2]White, E et al. , Applied Physics Letters 107 (2015), 223104.Google Scholar
[3]Everhart, TE and Thornley, RFM, Journal of Scientific Instruments 37 (1960), p. 246.Google Scholar
[4]Inada, H et al. , Ultramicroscopy 111 (2011), p. 865.Google Scholar
[5]Walsh, CA, Ultramicroscopy 45 (1992), p 85.Google Scholar
[6]The authors would like to thank Claude Kroupa, Robert Bent, and Nathan Didier from JEOL for their help with accessing and modifying the sample holder biasing circuit. Data presented here were acquired at the Core Center of Excellence in Nano Imaging (CNI) at the University of Southern California. This work was supported by National Science Foundation (NSF) award DMR-1611036 and by NSF STC award DMR-1548924 (STROBE).Google Scholar