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Addressing Pseudo-Symmetric Misindexing in EBSD Analysis of γ-TiAl with High Accuracy Band Detection

Published online by Cambridge University Press:  23 September 2015

Scott Sitzman ,
Niels-Henrik Schmidt ,
Alberto Palomares-Garcia ,
Rocio Munoz-Moreno  and
Jenny Goulden
Scott Sitzman
Affiliation:
Oxford Instruments America, Inc., Concord, MA, USA
Niels-Henrik Schmidt
Affiliation:
Oxford Instruments NanoAnalysis, High Wycombe, Buckinghamshire, UK
Alberto Palomares-Garcia
Affiliation:
IMDEA Materials Institute, Madrid, Spain
Rocio Munoz-Moreno
Affiliation:
Rolls-Royce UTC, University of Cambridge, Cambridge, UK
Jenny Goulden
Affiliation:
Oxford Instruments NanoAnalysis, High Wycombe, Buckinghamshire, UK

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 2037 - 2038
Copyright
Copyright © Microscopy Society of America 2015 

References

[1] Thomsen, K., et al., Royal Microscopy Society EBSD 2014 conference proceedings (2014).Google Scholar
[2] Zambaldi, C., et al, J. Appl. Cryst 42 (2009). p. 1092–1101.Google Scholar