Crossref Citations
This article has been cited by the following publications. This list is generated based on data provided by Crossref.
Murakami, Y.
Sasaki, T.T.
Ohkubo, T.
and
Hono, K.
2015.
Strain measurements from Nd2Fe14B grains in sintered magnets using artificial moiré fringes.
Acta Materialia,
Vol. 101,
Issue. ,
p.
101.
Okunishi, Eiji
and
Kondo, Yukihito
2016.
Pseudo Atomic Column EELS & EDS Mapping of Silicon Reconstructed With K and L Electrons Using STEM-Moiré Method.
Microscopy and Microanalysis,
Vol. 22,
Issue. S3,
p.
264.
Jones, Lewys
Wenner, Sigurd
Nord, Magnus
Ninive, Per Harald
Løvvik, Ole Martin
Holmestad, Randi
and
Nellist, Peter D.
2017.
Optimising multi-frame ADF-STEM for high-precision atomic-resolution strain mapping.
Ultramicroscopy,
Vol. 179,
Issue. ,
p.
57.
Ishizuka, Akimitsu
Hytch, Martin
and
Ishizuka, Kazuo
2017.
STEM moiré analysis for 2D strain measurements.
Journal of Electron Microscopy,
Vol. 66,
Issue. 3,
p.
217.
Kondo, Yukihito
Endo, Noriaki
Fukunaga, Kei-ichi
Aoyama, Yoshitaka
Asayama, Kyoichiro
Lin, Ching Chun
and
Kim, Hsu
2018.
Strain Analysis of FinFET Device Utilizing Moiré Fringes in Scanning Transmission Electron Microscopy.
Microscopy and Microanalysis,
Vol. 24,
Issue. S1,
p.
978.
Kondo, Y.
Aoyama, Y.
Hashiguchi, H.
Lin, C. C.
Hsu, K.
Endo, N.
Asayama, K.
and
Fukunaga, K-I.
2019.
Strain measurement of a channel between Si/Ge stressors in a tri-gate field effect transistor utilizing moiré fringes in scanning transmission microscope images.
Applied Physics Letters,
Vol. 114,
Issue. 17,
Couillard, Martin
2021.
Micrometre-scale strain mapping of transistor arrays extracted from undersampled atomic-resolution images.
Micron,
Vol. 148,
Issue. ,
p.
103100.