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Absorption Corrections for a Four-Quadrant SuperX EDS Detector

Published online by Cambridge University Press:  27 August 2014

F. Yang ,
F. Scheltens ,
D. McComb ,
D.B. Williams  and
M. De Graef
F. Yang
Affiliation:
Dept. of Materials Science and Engineering, Ohio State Univ., Columbus OH 43210, USA
F. Scheltens
Affiliation:
Dept. of Materials Science and Engineering, Ohio State Univ., Columbus OH 43210, USA
D. McComb
Affiliation:
Dept. of Materials Science and Engineering, Ohio State Univ., Columbus OH 43210, USA
D.B. Williams
Affiliation:
Dept. of Materials Science and Engineering, Ohio State Univ., Columbus OH 43210, USA
M. De Graef
Affiliation:
Dept. of Materials Science and Engineering, Carnegie Mellon Univ., Pittsburgh PA 15213, USA

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 100 - 101
Copyright
Copyright © Microscopy Society of America 2014