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Absolute-Scale Quantitative Energy Dispersive X-ray Analysis in Aberration-Corrected Scanning Transmission Electron Microscopy

Published online by Cambridge University Press:  23 September 2015

Zhen Chen ,
Adrian J. D'Alfonso ,
Matthew Weyland ,
Daniel J. Taplin ,
Scott D. Findlay  and
Leslie J. Allen
Zhen Chen
Affiliation:
School of Physics and Astronomy, Monash University, Victoria 3800, Australia
Adrian J. D'Alfonso
Affiliation:
School of Physics, University of Melbourne, Victoria 3010, Australia
Matthew Weyland
Affiliation:
Monash Centre for Electron Microscopy, Monash University, Victoria 3800, Australia Department of Materials Engineering, Monash University, Victoria 3800, Australia
Daniel J. Taplin
Affiliation:
School of Physics and Astronomy, Monash University, Victoria 3800, Australia
Scott D. Findlay
Affiliation:
School of Physics and Astronomy, Monash University, Victoria 3800, Australia
Leslie J. Allen
Affiliation:
School of Physics, University of Melbourne, Victoria 3010, Australia

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 1079 - 1080
Copyright
Copyright © Microscopy Society of America 2015 

References

References:

[1] Goldstein, JI, et al in "Principles of Analytical Electron Microscopy" (ed. D.C. Joy et al, Plenum Press, New York (1986). p. 155.Google Scholar
[2] D'Alfonso, AJ, et al, Phys. Rev. B 81 (2010) 100101. (R).Google Scholar
[3] Chu, M, et al, Phys. Rev. Lett. 104 (2010) 196101.Google Scholar
[4] Kotula, PG, et al, Microscopy and Microanalysis 18 (2012). p. 691.Google Scholar
[5] Kothleitner, G, et al, Phys. Rev. Lett. 112 (2014) 085501.CrossRefGoogle Scholar
[6] Chen, Z, et al, Submitted for publication (2014.Google Scholar
[7] LeBeau, JM, et al, Ultramicroscopy 110 (2010). p. 118.Google Scholar
[8] Allen, LJ, et al, Ultramicroscopy (in press 2015). doi:10.1016/j.ultramic.2014.10.011..Google Scholar
[9] LeBeau, JM, et al, Phys. Rev. Lett. 100 (2008) 206101.Google Scholar
[10] The authors thank Dr N.J. Zaluzec, Argonne National Laboratory, and A. Sandborg, EDAX Inc., for assistance with the geometry of our EDX detector. This research was supported by the Australian Research Council under the Discovery Projects funding scheme (Projects DP110102228 and 140102538), its DECRA funding scheme (Project DE130100739) and its LIEF funding scheme (Project LE0454166)..Google Scholar