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X-Ray Mapping and Electron Back-Scattered Diffraction of Phases in Welded Materials

Published online by Cambridge University Press:  01 August 2004

Richard Wuhrer ,
Ken Moran ,
Paul Huggett ,
Matthew R Phillips  and
Besim Ben-Nissan
Richard Wuhrer
Affiliation:
University of Technology, Sydney, Australia
Ken Moran
Affiliation:
Moran Scientific, Australia
Paul Huggett
Affiliation:
University of Technology, Sydney, Australia
Matthew R Phillips
Affiliation:
University of Technology, Sydney, Australia
Besim Ben-Nissan
Affiliation:
University of Technology, Sydney, Australia
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Extract

Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Type
Research Article
Information
Microscopy and Microanalysis , Volume 10 , Issue S02 , August 2004 , pp. 916 - 917
Copyright
© 2004 Microscopy Society of America

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