Hostname: page-component-586b7cd67f-t8hqh Total loading time: 0 Render date: 2024-11-27T03:40:03.614Z Has data issue: false hasContentIssue false
  • English
  • Français

Valence Electron EELS Spectroscopy on Nanoparticle Surfaces

Published online by Cambridge University Press:  02 July 2020

C. Colliex ,
K. Suenaga ,
M. Kociak  and
O. Stephan
C. Colliex
Affiliation:
Laboratoire de Physique des Solides, Bat. 510, Universite Paris Sud, 91405, Orsay, France
K. Suenaga
Affiliation:
presently at JST-ICORP, Department of Physics, Meijo University, Nagoya, 468-8502, Japan
M. Kociak
Affiliation:
Laboratoire de Physique des Solides, Bat. 510, Universite Paris Sud, 91405, Orsay, France
O. Stephan
Affiliation:
presently at JST-ICORP, Department of Physics, Meijo University, Nagoya, 468-8502, Japan
Get access

Extract

A series of recent experiments, using electron as well as photon probes [1-3], have attracted considerable interest on the importance of surface plasmon modes in nanostructured media such as nanospheres, nanotubes, nanowires, nanopores or nanoholes.

The basic principle for STEM operation had early been recognized to be well suited to the investigation of cases where non penetrating electrons propagate at a given impact parameter from an external surface (along "aloof7 trajectories, using a terminology proposed by Warmack et al. [4]). One of the most spectacular effect is that signals attributed to the excitation of-surface plasmon modes could be detected in vacuum at distances as large as a few tens of nanometers from the outside surface of a specimen, see for instance [5] for the planar geometry and [6], for the spherical one. Most interpretations accounting for the spatial dependence of EELS spectra in the "aloof geometries, rely on models using the bulk dielectric coefficients of the material to describe the induced charges and polarization responsible for the specimen electric field acting on the probe electron and consequently for the measured energy loss.

Type
A. Howie Symposium: Celebration of Pioneering Electron Microscopy
Information
Microscopy and Microanalysis , Volume 5 , Issue S2: Proceedings: Microscopy & Microanalysis '99, Microscopy Society of America 57th Annual Meeting, Microbeam Analysis Society 33rd Annual Meeting, Portland, Oregon August 1-5, 1999 , August 1999 , pp. 668 - 669
Copyright
Copyright © Microscopy Society of America

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

[I] Cohen, H.et al., Phys. Rev. Lett. 80 (1998) 782CrossRefGoogle Scholar

[2] Klar, T. et al., Phys. Rev. Lett. 80 (1998) 4249CrossRefGoogle Scholar

[3] Ebbesen, T.W. et al., Nature 391(1998) 667CrossRefGoogle Scholar

[4] Warmack, R.J. et al., Phys. Rev. B 29 (1984) 4375CrossRefGoogle Scholar

[5] Batson, P.E., Ultramicroscopy 11 (1983) 299CrossRefGoogle Scholar

[6] Acheche, M. et al., Ultramicroscopy 20 (1986)Google Scholar

[7] Garcia Molina, R., Gras Marti, A, Howie, A. and Ritchie, R.H., J. Phys. C 18 (1985) 5335CrossRefGoogle Scholar

[8] Howie, A. and Milne, R.H., Ultramicroscopy 18 (1985) 427CrossRefGoogle Scholar

[9] Walls, M.G. and Howie, A., Ultramicroscopy 28 (1989) 40CrossRefGoogle Scholar

[10] Echenique, P.M., Howie, A. and Wheatley, D.J., Phil. Mag. B 56 (1987) 33CrossRefGoogle Scholar

[11] Colliex, C. et al., Mikrochimica Acta 114/115 (1994) 71CrossRefGoogle Scholar

[12] Stockli, T. et al., Phys. Rev. B 57 (1998) 15599CrossRefGoogle Scholar

[13] Stephan, O., Henrard, L., Colliex, C., in preparation (1999)Google Scholar

[14] Howie, A. and Walsh, C., Microsc. Microanal. Microstruct. 2 (1991) 171CrossRefGoogle Scholar

[15] Bouchet, D. and Colliex, C., in preparation (1999)Google Scholar