Hostname: page-component-78c5997874-lj6df Total loading time: 0 Render date: 2024-11-03T04:08:08.138Z Has data issue: false hasContentIssue false
  • English
  • Français

Useful Lead and Bismuth Standards for Quantitative Electron ProbeMicroanalysis

Published online by Cambridge University Press:  02 July 2020

R. B. Marinenko  and
E. S. Windsor
R. B. Marinenko
Affiliation:
National Institute of Standards and Technology (NIST), 100 Bureau Dr., MS 8371, Gaithersburg, MD20899-8371
E. S. Windsor
Affiliation:
National Institute of Standards and Technology (NIST), 100 Bureau Dr., MS 8371, Gaithersburg, MD20899-8371
Get access

Extract

Lead and bismuth standards for quantitative electron probe microanalysis have always been a problem due to mechanical polishing and surface oxidation upon atmospheric exposure. Some Pb and Bi compounds, such as the selenides and tellurides, can be obtained commercially as solid pieces that are large enough to be mounted as useful standards, but they can also form non-stoichiometric solid solutions. This paper is a description of the initial work done on the testing of some selenides and tellurides to evaluate their usefulness as standards for quantitation. In addition, improved procedures for preparing the Pb and Bi element and compound specimens are being used to reduce surface oxidation. Primarily Pb samples were evaluated here, but the project will be extended in the future to include more Bi materials.

Experimental

Most specimens were mounted in silver epoxy in multi-element mounts that were repolished according to the description below. Additional specimens of PbTe, PbSe, and Pb were mounted in epoxy for this work.

Type
Problem Elements and Spectrometry Problems II
Information
Microscopy and Microanalysis , Volume 6 , Issue S2: Proceedings: Microscopy & Microanalysis 2000, Microscopy Society of America 58th Annual Meeting, Microbeam Analysis Society 34th Annual Meeting, Microscopical Society of Canada/Societe de Microscopie de Canada 27th Annual Meeting, Philadelphia, Pennsylvania August 13-17, 2000 , August 2000 , pp. 934 - 935
Copyright
Copyright © Microscopy Society of America

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

References:

1.Vahaaho, J. M. and Zielinski, P. A., Microsc. & Microanal 5(1999)918.CrossRefGoogle Scholar
2.J. T. Armstrong, , Microbeam Analysis-1988 (1988)239.Google Scholar
3.Bastin, G. F..et al., Heinrich, K.F.J. and Newbury, D.E., eds., Electron Probe Quantitation, Plenum Press (1991) 145.CrossRefGoogle Scholar
4.Marinenko, R. B. et al., Glasses for Microanalysis: SRM's 1871-1875, Washington, D.C., NIST Special Publication 260–112 (1990).Google Scholar
5.Ross, D. K. et al., Microbeam Analysis-1990 (1990)185.Google Scholar