Hostname: page-component-586b7cd67f-2brh9 Total loading time: 0 Render date: 2024-11-20T11:21:58.465Z Has data issue: false hasContentIssue false
  • English
  • Français

Unit-cell Scale Measurements of Oxygen Vacancy Concentration and Homogeneity in SOFC Cobaltite Thin Films

Published online by Cambridge University Press:  23 November 2012

Y. Kim ,
J. He ,
M.D. Biegalski ,
H.A. Ambaye ,
V. Lauter ,
H.M. Christen ,
S.J. Pennycook ,
S.V. Kalinin  and
S.T. Pantelides
Y. Kim
Affiliation:
Materials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, TN
J. He
Affiliation:
Materials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, TN
M.D. Biegalski
Affiliation:
Materials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, TN
H.A. Ambaye
Affiliation:
Materials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, TN
V. Lauter
Affiliation:
Materials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, TN
H.M. Christen
Affiliation:
Materials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, TN
S.J. Pennycook
Affiliation:
Materials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, TN
S.V. Kalinin
Affiliation:
Materials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, TN
S.T. Pantelides
Affiliation:
Vanderbilt University, Nashville, TN
Get access

Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Type
Research Article
Information
Microscopy and Microanalysis , Volume 18 , Issue S2: Proceedings of Microscopy & Microanalysis 2012 , July 2012 , pp. 1310 - 1311
Copyright
Copyright © Microscopy Society of America 2012

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)