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Understanding the Effects of Graphene Coating on the Electrostatic Field at the Tip of an Atom Probe Tomography Specimen

Published online by Cambridge University Press:  30 July 2021

Florant Exertier ,
Jiangting Wang ,
Jing Fu  and
Ross K.W. Marceau Open the ORCID record for Ross K.W. Marceau [Opens in a new window]
Florant Exertier*
Affiliation:
Deakin University, Institute for Frontier Materials, Geelong, VIC 3216, Australia
Jiangting Wang
Affiliation:
Deakin University, Institute for Frontier Materials, Geelong, VIC 3216, Australia
Jing Fu
Affiliation:
Department of Mechanical and Aerospace Engineering, Monash University, Clayton, VIC 3800, Australia
Ross K.W. Marceau*
Affiliation:
Deakin University, Institute for Frontier Materials, Geelong, VIC 3216, Australia
*
*Corresponding authors: Florant Exertier, E-mail: [email protected]; Ross K.W. Marceau, E-mail: [email protected]
*Corresponding authors: Florant Exertier, E-mail: [email protected]; Ross K.W. Marceau, E-mail: [email protected]
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Abstract

As a three-dimensional characterization method, atom probe tomography can provide key information that other methods cannot offer. Conductive coatings have proved to be an effective way for biological samples, and nonconductive samples in general, to be analyzed using voltage-pulsed atom probe tomography. In this study, we analyzed the effects of graphene coating on an electrically conductive material and were able to confirm the detection of carbon atoms. We compare quantitative electrostatic field metrics for a single-coated and a multi-coated specimen and measure both a reduced voltage after graphene coating and lowered charge-state ratios for different ion species, suggesting a lowered evaporation field related to the graphene coating. This information will be instructive for future studies on graphene-coated, nonconductive biological specimens.

Keywords

application to nonconductive biological specimensatom probe tomographycharge-state ratiofield-evaporationgraphene coatingvoltage-pulse APT
Type
Development and Computation
Information
Microscopy and Microanalysis , Volume 28 , Issue 4 , August 2022 , pp. 1054 - 1065
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Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America

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