Hostname: page-component-586b7cd67f-tf8b9 Total loading time: 0 Render date: 2024-11-26T11:06:43.788Z Has data issue: false hasContentIssue false
  • English
  • Français

Ultralow-Energy Excitations and Prospects for Spatially Resolved Spectroscopy

Published online by Cambridge University Press:  22 January 2004

A. Howie
A. Howie
Affiliation:
Cavendish Laboratory, University of Cambridge, Madingley Road, Cambridge CB3 0HE, UK
Get access

Abstract

The key contribution of electron microscopy methods to condensed matter spectroscopy is undoubtedly spatial resolution. So far this has mainly been manifest through electron energy loss spectroscopy in the 1-eV to 10-keV energy range and has not seriously challenged the dominance of optical, X-ray, and neutron spectroscopy methods over most of the vast field at lower energies. At frequencies up to a few megahertz, corresponding to energies of a few nanoelectron volts and below, direct excitation by pulsed electron beams or electric fields has proved effective. Prospects are discussed for extending spatially resolved spectroscopy to the intermediate energy region, mainly by combining the advantages of electrons with those of photons.

Keywords

spatial spectroscopypulsed-beam STEMSEAMPEEMapertureless near-field microscopy
Type
Research Article
Information
Microscopy and Microanalysis , Volume 10 , Issue 1 , February 2004 , pp. 28 - 33
Copyright
© 2004 Microscopy Society of America

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

Anderson, M.S. & Pike, W.T. (2002). A Raman-atomic force microscope for apertureless-near-field spectroscopy and optical trapping. Rev Sci Instrum 73, 1198–1203.Google Scholar
Balk, L.J., Davies, D.J., & Kultscher, N. (1984). The dependence of scanning electron acoustic microscopy (SEAM) images on chopping and detection frequency in metal samples. Phys Status Solidi A 82, 23–33.Google Scholar
Bauer, E. (2001). Photoelectron microscopy. J Phys (Condensed Matter) 13, 11391–11404.Google Scholar
Boersch, H., Geiger, J., & Stickel, W. (1966). Interaction of 25-keV electrons with lattice vibrations in LiF. Phys Rev Lett 17, 379–381.Google Scholar
Burkel, E. (2000). Phonon spectroscopy by inelastic X-ray scattering. Rep Progr Phys 63, 171–232.Google Scholar
Cargill, G.S. (1980). Ultrasonic imaging in scanning electron microscopy. Nature 286, 691–693.Google Scholar
Davies, G., Howie, A., & Staveley-Smith, L. (1982). Scanning electron acoustic microscopy. SPIE Proc 368, 58–65.Google Scholar
Durkan, C. & Welland, M.E. (2002). Electronic spin detection in molecules using scanning-tunneling-microscopy-assisted electron spin resonance. Appl Phys Lett 80, 458–460.Google Scholar
Echenique, P.M., Ritchie, R.F., & Brandt, W. (1979). Spatial excitation patterns induced by swift ions in condensed matter. Phys Rev B 20, 2567–2580.Google Scholar
Gao, H.J., Duscher, G., Kim, M., Pennycook, S.J., Kumar, D., Cho, K.G., & Singh, R.K. (2000). Catodoluminescent properties at nanometer resolution through Z-contrast scanning transmission electron microscopy. Appl Phys Lett 77, 594–596.CrossRefGoogle Scholar
Gavindaraj, R., Kesavamoorthy, R., Mythili, R., & Viswanathan, B. (2001). The formation and characterization of silver clusters in zirconia. J Appl Phys 90, 958–963.Google Scholar
Gray, S.M. (2000). Photoemission with STM. J Electron Spectr Rel Phenom 109, 183–196.Google Scholar
Gustafsson, A., Pistol, M.-E., Montelius, L., & Samuelson, L. (1998). Local probe techniques for luminescence studies of low dimensional semiconductor structures. J Appl Phys 84, 1715–1775.CrossRefGoogle Scholar
Hamann, H.F., Kuno, M., Gallagher, A., & Nesbitt, D.J. (2001). Molecular fluorescence in the vicinity of a nanoscopic probe. J Chem Phys 114, 8596–8609.Google Scholar
Howie, A. (1999). Interpretation of spatially resolved valence loss spectra. In Topics in Electron Diffraction and Microscopy of Materials, Hirsch, P.B. (Ed.), pp. 79–104. Bristol and Philadelphia: Institute of Physics.
Lehman, M., Geiger, D., Buscher, I., Zandbergen, H.W., Van Dyck, D., & Lichte, H. (2002). Quantitative analysis of focal series of off-axis electron holograms. In 15th Int. Congr. On Electron Microscopy, ICEM15, Durban South Africa, Engelbrecht, J., Sewell, T., Witcomb., M., Cross R. & Richards, P. (Eds.), vol. 3, pp. 279–280. Ondrespoort, South Africa: Microscopy Society of South Africa.
Liu, J. & Cowley, J.M. (1993). Scanning reflection electron microscopy and associated techniques for surface studies. Ultramicroscopy 48, 381–416.Google Scholar
Martin, Y., Zenhausem, F., & Wickramasinghe, H.K. (1996). Scattering spectroscopy of molecules at nanometer resolution. Appl Phys Lett 68, 2475–2477.Google Scholar
Mook, H.W., Batson, P.E., & Kruit, P. (1999). Operation of the fringe field monochromator in field emission STEM. In Electron Microscopy and Analysis 1999, Institute of Physics Conference Series vol. 161, pp. 223–226. Philadelphia: Institute of Physics.
Osakabe, N., Harada, K., Lutwyche, M.I., Kasai, H., & Tonomura, A. (1997). Time resolved observation of thermal oscillations by transmission electron microscopy. Appl Phys Lett 70, 940–942.Google Scholar
Pennycook, S.J., Brown, L.M., & Craven, A.J. (1980). Observation of cathodoluminescence at single dislocations by STEM. Phil Mag A 41, 589–600.Google Scholar
Poncharal, P., Wang, Z.L., Ugarte, D., & De Heer, W.A. (1999). Electrostatic deflections and electrochemical resonances of carbon nanotubes. Science 283, 1513–1516.Google Scholar
Rivacoba, A., Zabala, N., & Aizpurua, J. (2000). Image potential in scanning electron microscopy. Progr Surf Sci 65, 1–64.Google Scholar
Sanchez, E.J., Novotny, L., & Sunney Xie, X. (1999). Near-field fluorescence microscopy based on two-photon excitation with metal tips. Phys Rev Lett 82, 4014–4017.Google Scholar
Terauchi, M., Tanaka, M., Tsuno, K., & Ishida, M. (1999). Development of a high energy resolution electron energy-loss spectroscopy microscope. J Microsc 194, 203–209.Google Scholar
Treacy, M.M.J., Ebbesen, T.W., & Gibson, J.M. (1996). Exceptionally high Young's modulus observed for individual carbon nanotubes. Nature 381, 678–680.Google Scholar
Uehara, Y., Yagami, A., Ito, J., & Ushioda, S. (2000). Scanning tunneling microscope light emission spectroscopy with picosecond time resolution. Appl Phys Lett 76, 2487–2489.Google Scholar
Wang, Z.L. & Cowley, J.M. (1988). Reflection electron-energy loss spectroscopy (REELS)—A technique for the study of surfaces. Surf Sci 193, 501–512.Google Scholar
Williamson, J.C., Cao, J., Thee, H., Frey, H., & Zewail, A. (1997). Clocking transient chemical changes by ultrafast electron diffraction. Nature 386, 159–162.Google Scholar
Yamamoto, M., Araya, K., Toda, A., & Sugiyama, H. (2001). Photon emission for silver particles induced by a high-energy electron beam. Phys Rev B 64, 205419-1–205419-9.Google Scholar