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Transmission Electron Microscopy for Characterization of Vial Glass Delamination Flakes

Published online by Cambridge University Press:  23 November 2012

E.F. Schumacher ,
K.J. Diebold ,
S.F. Stoeffler  and
A.W. Nicholls
E.F. Schumacher
Affiliation:
McCrone Associates, Inc., Westmont, IL
K.J. Diebold
Affiliation:
McCrone Associates, Inc., Westmont, IL
S.F. Stoeffler
Affiliation:
McCrone Associates, Inc., Westmont, IL
A.W. Nicholls
Affiliation:
University of Illinois at Chicago, Chicago, IL
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Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Type
Research Article
Information
Microscopy and Microanalysis , Volume 18 , Issue S2: Proceedings of Microscopy & Microanalysis 2012 , July 2012 , pp. 244 - 245
Copyright
Copyright © Microscopy Society of America 2012

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