Hostname: page-component-78c5997874-v9fdk Total loading time: 0 Render date: 2024-11-17T16:54:20.877Z Has data issue: false hasContentIssue false
  • English
  • Français

Toward Ultrafast Electron Microscopy

Published online by Cambridge University Press:  01 August 2004

Wayne E. King ,
Geoffrey H. Campbell ,
Alan Frank ,
Bryan Reed ,
John Schmerge ,
Bradley Siwick ,
Brent Stuart  and
Peter Weber
Wayne E. King
Affiliation:
University of California Lawrence Livermore National Laboratory, Livermore, California
Geoffrey H. Campbell
Affiliation:
University of California Lawrence Livermore National Laboratory, Livermore, California
Alan Frank
Affiliation:
University of California Lawrence Livermore National Laboratory, Livermore, California
Bryan Reed
Affiliation:
University of California Lawrence Livermore National Laboratory, Livermore, California
John Schmerge
Affiliation:
Stanford University, Menlo Park, California
Bradley Siwick
Affiliation:
FOM Institute for Atomic and Molecular Physics, Amsterdam, The Netherlands
Brent Stuart
Affiliation:
University of California Lawrence Livermore National Laboratory, Livermore, California
Peter Weber
Affiliation:
Brown University, Providence, Rhode Island
Get access

Extract

Extended abstract of a paper presented at the Pre-Meeting Congress: Materials Research in an Aberration-Free Environment, at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, July 31 and August 1, 2004.

Type
Research Article
Information
Microscopy and Microanalysis , Volume 10 , Issue S03 , August 2004 , pp. 14 - 15
Copyright
© 2004 Microscopy Society of America

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)