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Three-Dimensional Characterization of Pigment Dispersion in Dried Paint Films Using Focused Ion Beam–Scanning Electron Microscopy

Published online by Cambridge University Press:  01 February 2012

Jui-Ching Lin ,
William Heeschen ,
John Reffner  and
John Hook
Jui-Ching Lin*
Affiliation:
The Dow Chemical Company, Analytical Sciences, Midland, MI 48667, USA
William Heeschen
Affiliation:
The Dow Chemical Company, Analytical Sciences, Midland, MI 48667, USA
John Reffner
Affiliation:
The Dow Chemical Company, Spring House Technical Center, 727 Norristown Road, Spring House, PA 19477-0904, USA
John Hook
Affiliation:
The Dow Chemical Company, Spring House Technical Center, 727 Norristown Road, Spring House, PA 19477-0904, USA
*
Corresponding author. E-mail: [email protected]
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Abstract

The combination of integrated focused ion beam–scanning electron microscope (FIB-SEM) serial sectioning and imaging techniques with image analysis provided quantitative characterization of three-dimensional (3D) pigment dispersion in dried paint films. The focused ion beam in a FIB-SEM dual beam system enables great control in slicing paints, and the sectioning process can be synchronized with SEM imaging providing high quality serial cross-section images for 3D reconstruction. Application of Euclidean distance map and ultimate eroded points image analysis methods can provide quantitative characterization of 3D particle distribution. It is concluded that 3D measurement of binder distribution in paints is effective to characterize the order of pigment dispersion in dried paint films.

Keywords

pigment dispersionFIBimage analysis3D
Type
Materials Applications
Information
Microscopy and Microanalysis , Volume 18 , Issue 2 , April 2012 , pp. 266 - 271
Copyright
Copyright © Microscopy Society of America 2012

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References

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