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TEM Investigation of Near Interface Region in Modified SrTiO3 and LaAlO3 Thin Films on SrTiO3 Substrates

Published online by Cambridge University Press:  05 August 2007

J Börjesson ,
A Kalabukhov ,
R Gunnarsson ,
E Olsson  and
D Winkler
J Börjesson
Affiliation:
Chalmers University of Technology,Sweden
A Kalabukhov
Affiliation:
Chalmers University of Technology,Sweden
R Gunnarsson
Affiliation:
Chalmers University of Technology,Sweden
E Olsson
Affiliation:
Chalmers University of Technology,Sweden
D Winkler
Affiliation:
Chalmers University of Technology,Sweden
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Extract

Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Type
Research Article
Information
Microscopy and Microanalysis , Volume 13 , Issue S02 , August 2007 , pp. 848 - 849
Copyright
© 2007 Microscopy Society of America

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