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TEM Analysis of Diamond Films Formed on SiO2 Substrate by Biasenhanced Nucleation

Published online by Cambridge University Press:  02 July 2020

S. C. Cheng
Affiliation:
Materials Characterization Laboratory The Pennsylvania State University, University Park, PA, 16802USA
M. D. Irwin
Affiliation:
Department of Materials Science and Engineering The Pennsylvania State University, University Park, PA, 16802USA
C. Onneby
Affiliation:
Department of Materials Science and Engineering The Pennsylvania State University, University Park, PA, 16802USA
C. G. Pantano
Affiliation:
Materials Characterization Laboratory The Pennsylvania State University, University Park, PA, 16802USA Department of Materials Science and Engineering The Pennsylvania State University, University Park, PA, 16802USA
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Substrates of fused silica or other refractory glasses are of interest for the fabrication of diamondbased electronic sensors (such as thermistors) and field-emitter arrays. For temperature-sensing applications, the diamond thin film layers must be deposited on thermally insulating substrates, in order to optimize the accuracy and dynamic response time of the device. Silica and silicate glasses are good insulators, providing a barrier to the heat flow out of the device and thereby allowing for optimized performance of temperature sensors. Also, fabrication of diamond field emitters on large area glass substrates is important for manufacture of field emission flat panel displays. Recently, it has been demonstrated that significant enhancement of diamond nucleation on Si02 substrates can be achieved by applying electrical bias to the substrate during its exposure to a microwave generated CH4/H2 plasma.

To investigate the nucleation mechanism of diamond on Si02 substrate, induced during the biasing pretreatment, several TEM techniques were used to characterize the films and the film/substrate interface.

Type
Microscopy of Ceramics and Minerals
Copyright
Copyright © Microscopy Society of America

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References

References:

1.Mao, M. Y. at el., Applied Physics Letters 66(1995)16.CrossRefGoogle Scholar
2.Irwin, M. D., Onneby, C., Wolter, S. D., Cheng, S. C. and Pantano, C. G., to be submmitted.Google Scholar
3.Egerton, R. F., Electron Energy Loss Spectroscopy in Electron Microscope, New YorkPlenum publishing Corp. (1986)6.Google Scholar