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A Study of Helium ion induced Secondary Electron Emission

Published online by Cambridge University Press:  03 August 2008

R Ramachandra ,
BJ Griffin  and
D Joy
R Ramachandra
Affiliation:
University of Tennessee
BJ Griffin
Affiliation:
University of Western Australia, Australia
D Joy
Affiliation:
University of Tennessee
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Extract

Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Type
Research Article
Information
Microscopy and Microanalysis , Volume 14 , Supplement S2 , August 2008 , pp. 1192 - 1193
Copyright
© 2008 Microscopy Society of America

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