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Studies of core structures and strain fields of extended defects in GaN using Exit-Wave-Reconstruction and numerical correction of lens aberrations

Published online by Cambridge University Press:  07 September 2007

Niermann T ,
Mai D ,
Roever M ,
Malindretos J ,
Rizzi A  and
Seibt M
Niermann T
Affiliation:
Georg-August-Universität Göttingen, Germany
Mai D
Affiliation:
Georg-August-Universität Göttingen, Germany
Roever M
Affiliation:
Georg-August-Universität Göttingen, Germany
Malindretos J
Affiliation:
Georg-August-Universität Göttingen, Germany
Rizzi A
Affiliation:
Georg-August-Universität Göttingen, Germany
Seibt M
Affiliation:
Georg-August-Universität Göttingen, Germany
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Extract

Extended abstract of a paper presented at MC 2007, 33rd DGE Conference in Saarbrücken, Germany, September 2 – September 7, 2007

Type
Research Article
Information
Microscopy and Microanalysis , Volume 13 , Issue S03 , September 2007 , pp. 38 - 39
Copyright
Copyright © Microscopy Society of America 2007

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