Hostname: page-component-586b7cd67f-r5fsc Total loading time: 0 Render date: 2024-11-26T16:28:00.521Z Has data issue: false hasContentIssue false

A Standard for Sub-Ångstrom Metrology of Resolution in Aberration-Corrected Transmission Electron Microscopes

Published online by Cambridge University Press:  01 August 2004

Michael A. O'Keefe
Affiliation:
Lawrence Berkeley National Laboratory, California
Lawrence F. Allard
Affiliation:
Oak Ridge National Laboratory, Tennessee
Get access

Extract

Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Type
Research Article
Copyright
© 2004 Microscopy Society of America

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)