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Single Atom Microscopy

Published online by Cambridge University Press:  23 November 2012

W. Zhou ,
J. Lee ,
A.R. Lupini ,
S.J. Pennycook ,
J. Idrobo ,
M.P. Prange ,
M.P. Oxley ,
S.T. Pantelides  and
O.L. Krivanek
W. Zhou
Affiliation:
Oak Ridge National Laboratory, Oak Ridge, TN
J. Lee
Affiliation:
Oak Ridge National Laboratory, Oak Ridge, TN
A.R. Lupini
Affiliation:
Oak Ridge National Laboratory, Oak Ridge, TN
S.J. Pennycook
Affiliation:
Oak Ridge National Laboratory, Oak Ridge, TN
J. Idrobo
Affiliation:
Oak Ridge National Laboratory, Oak Ridge, TN
M.P. Prange
Affiliation:
Vanderbilt University, Nashville, TN
M.P. Oxley
Affiliation:
Vanderbilt University, Nashville, TN
S.T. Pantelides
Affiliation:
Vanderbilt University, Nashville, TN
O.L. Krivanek
Affiliation:
Nion Co., Kirkland, WA
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Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Type
Research Article
Information
Microscopy and Microanalysis , Volume 18 , Issue S2: Proceedings of Microscopy & Microanalysis 2012 , July 2012 , pp. 342 - 343
Copyright
Copyright © Microscopy Society of America 2012

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