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Simultaneous Imaging of Surface and Bulk at Atomic Resolution

Published online by Cambridge University Press:  23 November 2012

Y. Zhu ,
L. Wu ,
D. Su ,
C. Cheng ,
J. Ciston ,
H. Inada ,
Y. Suzuki ,
K. Tamura ,
M. Konno  and
R. Egerton
...Show all authors
Y. Zhu
Affiliation:
Brookhaven National Laboratory, Upton, NY
L. Wu
Affiliation:
Brookhaven National Laboratory, Upton, NY
D. Su
Affiliation:
Brookhaven National Laboratory, Upton, NY
C. Cheng
Affiliation:
Brookhaven National Laboratory, Upton, NY
J. Ciston
Affiliation:
Lawrence Berkeley National Laboratory, Berkeley, CA
H. Inada
Affiliation:
Hitachi High Technologies Corp., Ibaraki, Japan
Y. Suzuki
Affiliation:
Hitachi High Technologies Corp., Ibaraki, Japan
K. Tamura
Affiliation:
Hitachi High Technologies Corp., Ibaraki, Japan
M. Konno
Affiliation:
Hitachi High Technologies Corp., Ibaraki, Japan
R. Egerton
Affiliation:
University of Alberta, Edmonton, Alberta, Canada
L. Marks
Affiliation:
Northwestern University, Evanston, IL
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Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Type
Research Article
Information
Microscopy and Microanalysis , Volume 18 , Issue S2: Proceedings of Microscopy & Microanalysis 2012 , July 2012 , pp. 306 - 307
Copyright
Copyright © Microscopy Society of America 2012

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