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A Simple Algorithm to Eliminate Ambiguities in EBSD Orientation Map Visualization and Analyses: Application to Fatigue Crack-Tips/Wakes in Aluminum Alloys

Published online by Cambridge University Press:  25 October 2010

Vipul K. Gupta  and
Sean R. Agnew
Vipul K. Gupta*
Affiliation:
Department of Materials Science and Engineering, University of Virginia, Charlottesville, VA 22904-4745, USA
Sean R. Agnew
Affiliation:
Department of Materials Science and Engineering, University of Virginia, Charlottesville, VA 22904-4745, USA
*
Corresponding author. E-mail: [email protected]
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Abstract

A simple algorithm is developed and implemented to eliminate ambiguities, in both statistical analyses of orientation data (e.g., orientation averaging) and electron backscattered diffraction (EBSD) orientation map visualization, caused by symmetrically equivalent orientations and the wrap-around or umklapp effect. Using crystal symmetry operators and the lowest Euclidian-distance criterion, the orientation of each pixel within a grain is redefined. An advantage of this approach is demonstrated for direct determination of the representative orientation of a grain within an EBSD map by mean, median, or quaternion-based averaging methods that can be further used within analyses or visualization of misorientation or geometrically necessary dislocation (GND) density. If one also considers the lattice curvature tensor, five components of the dislocation density tensor—corresponding to a part of the GND content—may be inferred. The methodology developed is illustrated using EBSD orientation data obtained from the fatigue crack-tips/wakes in aerospace aluminum alloys 2024-T351 and 7050-T7451.

Keywords

wrap-aroundcrystal symmetryquaternionorientation maplattice curvatureNye tensor
Type
Instrumentation and Software Developments
Information
Microscopy and Microanalysis , Volume 16 , Issue 6 , December 2010 , pp. 831 - 841
Copyright
Copyright © Microscopy Society of America 2010

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References

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