No CrossRef data available.
Published online by Cambridge University Press: 02 July 2020
We present a new method of fluorescence imaging, which yields an unprecedented nm scale vertical resolution. The method uses the unique spectral signature of the fluorescent emission intensity above a reflecting surface to determine vertical position unambiguously. Emission from several heights could be resolved by deconvoluting the spectrum, so that three dimensional imaging is possible. The related technique of standing wave microscopy uses the spatial intensity variation for increased resolution. Applications of this technique include intracellular imaging and screening for specific bacteria, virus or proteins, where discrimination between raised fluorescently labeled specifically bound markers from non-specific binding is crucial.
The emission spectrum of fluorescent markers is modified in the presence of a reflecting surface. Within the wavelength range of the fluorescent emission, the selfinterference of the emitted photons from the direct and reflected path results in enhanced or suppressed emission (constructive or destructive interference) depending on the height and wavelength.
1. Bailey, B., Farkas, D., Taylor, D, Lanni, F., Nature 366, 44, 1993CrossRefGoogle Scholar
2. Lambacher, A., Fromherz, P, Appl. Phys. A 63, 207, 1996CrossRefGoogle Scholar