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Selected-Area Growth of Carbon Nanotubes by the Combination of Focused Ion Beam and Chemical Vapor Deposition Techniques

Published online by Cambridge University Press:  21 November 2003

Jun Jiao ,
Lifeng Dong ,
Sean Foxley ,
Catherine L. Mosher  and
David W. Tuggle
Jun Jiao
Affiliation:
Department of Physics, Portland State University, Portland, Oregon 97201, USA
Lifeng Dong
Affiliation:
Department of Physics, Portland State University, Portland, Oregon 97201, USA
Sean Foxley
Affiliation:
Department of Physics, Portland State University, Portland, Oregon 97201, USA
Catherine L. Mosher
Affiliation:
Department of Physics, Portland State University, Portland, Oregon 97201, USA
David W. Tuggle
Affiliation:
Department of Physics, Portland State University, Portland, Oregon 97201, USA
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Abstract

In this article, we report a technique for growing carbon nanotubes in a more controllable fashion, which enables us to synthesize nanotubes directly in various forms of designed patterns. This nanofabrication process is based on a combination of focused ion beam (FIB) and chemical vapor deposition (CVD) techniques. In this process, arrays of conductive patterns were first deposited on silicon substrates by directing a gaseous compound (C9H16Pt) via the capillary needle-sized nozzles within a FIB system. The substrates were then coated with catalyst and further modified by the FIB to localize the position of the catalyst. Finally, the growth of carbon nanotubes on the designed substrates was carried out by CVD of hydrocarbon gases. This fabrication technique has the advantage of positioning carbon nanotubes in selected locations. This may open up opportunities for the direct synthesis of carbon nanotubes onto almost any substrate material, thus allowing fabrication of carbon nanotube-based devices.

Keywords

focused ion beamchemical vapor depositionnanofabricationpatterned growthcarbon nanotubesHRTEM
Type
Materials Applications
Information
Microscopy and Microanalysis , Volume 9 , Issue 6 , December 2003 , pp. 516 - 521
Copyright
© 2003 Microscopy Society of America

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References

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