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Scanning Electron Microscopy and X-Ray Microanalysis 4th Edition, Joseph I. Goldstein, Dale E. Newbury, Joseph R. Michael, Nicholas W.M. Ritchie, John Henry J. Scott, David C. Joy, Springer, 2018, 550 pp. ISBN:978-1-4939-6674-5.

Published online by Cambridge University Press:  30 October 2018

Lucille A. Giannuzzi
Lucille A. Giannuzzi*
Affiliation:
L.A. Giannuzzi & Associates LLC, Fort Myers, FL 33913, USA EXpressLO LLC, Lehigh Acres, FL 33971,USA
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Type
Book Review
Information
Microscopy and Microanalysis , Volume 24 , Issue 6 , December 2018 , pp. 768
Copyright
© Microscopy Society of America 2018 

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Footnotes

Cite this article: Giannuzzi LA (2018) Scanning Electron Microscopy and X-Ray Microanalysis. Microsc Microanal. 24(6), 768. doi: 10.1017/S1431927618015271

References

Cite this article: Giannuzzi LA (2018) Scanning Electron Microscopy and X-Ray Microanalysis. Microsc Microanal. 24(6), 768. doi: 10.1017/S1431927618015271