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Scanning Confocal Electron Microscopy (SCEM) Combined with Deconvolution Technique

Published online by Cambridge University Press:  23 November 2012

M. Takeguchi ,
A. Hashimoto ,
K. Mitsuishi ,
X. Zhang ,
M. Shimojo ,
P. Wang ,
N.D. Peter  and
A.I. Kirkland
M. Takeguchi
Affiliation:
National Institute for Materials Science, Tsukuba, Ibaraki, Japan
A. Hashimoto
Affiliation:
National Institute for Materials Science, Tsukuba, Ibaraki, Japan
K. Mitsuishi
Affiliation:
National Institute for Materials Science, Tsukuba, Ibaraki, Japan
X. Zhang
Affiliation:
Saitama Institute of Technology, Fukaya, Saitama, Japan
M. Shimojo
Affiliation:
Shibaura Institute of Technology, Toyosu, Tokyo, Japan
P. Wang
Affiliation:
University of Oxford, Oxford, Oxford, United Kingdom
N.D. Peter
Affiliation:
University of Oxford, Oxford, Oxford, United Kingdom
A.I. Kirkland
Affiliation:
University of Oxford, Oxford, Oxford, United Kingdom
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Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Type
Research Article
Information
Microscopy and Microanalysis , Volume 18 , Issue S2: Proceedings of Microscopy & Microanalysis 2012 , July 2012 , pp. 332 - 333
Copyright
Copyright © Microscopy Society of America 2012

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