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Role of Planar Defects in Compound Semiconductor Crystals: From Growth of Nanomasts & Nanosails to Processing Light Emission in DualBeam FIB/SEM

Published online by Cambridge University Press:  05 August 2007

WJ MoberlyChan
Affiliation:
Lawrence Livermore National Laboratory
J Tringe
Affiliation:
Lawrence Livermore National Laboratory
I Shalish
Affiliation:
Harvard University
V Narayanamurti
Affiliation:
Harvard University
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Extract

Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Type
Research Article
Copyright
© 2007 Microscopy Society of America

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