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Remote Teaching for Electron Microscopy

Published online by Cambridge University Press:  03 August 2008

TC Isabell ,
Y Ohkura ,
T Kobayashi  and
RM O'Donnell
TC Isabell
Affiliation:
JEOL USA, Inc
Y Ohkura
Affiliation:
JEOL Ltd, Japan
T Kobayashi
Affiliation:
JEOL Ltd, Japan
RM O'Donnell
Affiliation:
O'Donnell Engineering
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Extract

Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Type
Research Article
Information
Microscopy and Microanalysis , Volume 14 , Supplement S2 , August 2008 , pp. 872 - 873
Copyright
© 2008 Microscopy Society of America

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