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Quantitative Cathodoluminescence Mapping with Application to a Kalgoorlie Scheelite

Published online by Cambridge University Press:  22 May 2009

Colin M. MacRae ,
Nicholas C. Wilson  and
Joel Brugger
Colin M. MacRae*
Affiliation:
Microbeam Laboratory, CSIRO Minerals, Bayview Avenue, Clayton, Victoria 3168, Australia
Nicholas C. Wilson
Affiliation:
Microbeam Laboratory, CSIRO Minerals, Bayview Avenue, Clayton, Victoria 3168, Australia
Joel Brugger
Affiliation:
School of Earth and Environmental Sciences, University of Adelaide, SA 5005; and Division of Minerals, South Australian Museum, North Terrace, Adelaide, SA 5000, Australia
*
Corresponding author. E-mail: [email protected]
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Abstract

A method for the analysis of cathodoluminescence spectra is described that enables quantitative trace-element-level distributions to be mapped within minerals and materials. Cathodoluminescence intensities for a number of rare earth elements are determined by Gaussian peak fitting, and these intensities show positive correlation with independently measured concentrations down to parts per million levels. The ability to quantify cathodoluminescence spectra provides a powerful tool to determine both trace element abundances and charge state, while major elemental levels can be determined using more traditional X-ray spectrometry. To illustrate the approach, a scheelite from Kalgoorlie, Western Australia, is hyperspectrally mapped and the cathodoluminescence is calibrated against microanalyses collected using a laser ablation inductively coupled plasma mass spectrometer. Trace element maps show micron scale zoning for the rare earth elements Sm3+, Dy3+, Er3+, and Eu3+/Eu2+. The distribution of Eu2+/Eu3+ suggests that both valences of Eu have been preserved in the scheelite since its crystallization 1.63 billion years ago.

Keywords

cathodoluminescencemappinghyperspectralquantificationspectroscopymicroanalysiselectron microprobescheeliterare earth elements
Type
Materials Applications
Information
Microscopy and Microanalysis , Volume 15 , Issue 3 , June 2009 , pp. 222 - 230
Copyright
Copyright © Microscopy Society of America 2009

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