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Quantification of X-ray Spectrum Images in the Analytical Electron Microscope: Progress Toward Single-Atom-Detection Limits

Published online by Cambridge University Press:  05 August 2007

D Williams
Affiliation:
Lehigh University
D Ackland
Affiliation:
Lehigh University
M Watanabe
Affiliation:
Lehigh University
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Extract

Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Type
Research Article
Copyright
© 2007 Microscopy Society of America

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