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Quantification of Compositional Modulations in Self-Assembled Multisheet (Cd, Zn, Mn)Se Quantum Dot Structures

Published online by Cambridge University Press:  02 July 2020

T. Topuria ,
P. Möck ,
N.D. Browning ,
L.V. Titova ,
M. Dobrowolska ,
S. Lee  and
J.K. Furdyna
T. Topuria
Affiliation:
University of Illinois at Chicago, Department of Physics, Chicago, IL, 60607-7059–
P. Möck
Affiliation:
University of Illinois at Chicago, Department of Physics, Chicago, IL, 60607-7059–
N.D. Browning
Affiliation:
University of Illinois at Chicago, Department of Physics, Chicago, IL, 60607-7059–
L.V. Titova
Affiliation:
University of Notre Dame, Department of Physics, Notre Dame, IN, 46556
M. Dobrowolska
Affiliation:
University of Notre Dame, Department of Physics, Notre Dame, IN, 46556
S. Lee
Affiliation:
University of Notre Dame, Department of Physics, Notre Dame, IN, 46556
J.K. Furdyna
Affiliation:
University of Notre Dame, Department of Physics, Notre Dame, IN, 46556
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Abstract

CdSe/ZnSe based semiconductor quantum dot (Q D) structures are a promising candidate for optoelectronic device applications. However, key to the luminescence properties is the cation distribution and ordering on the atomic level within the CdSe QDs/agglomerates. Here the Z contrast imaging technique in the scanning transmission electron microscope (STEM) is employed to study multisheet (Cd,Zn,Mn)Se QD structures. Since Z-contrast is an incoherent imaging technique, problems associated with strain contrast in conventional TEM are avoided an accurate size and composition determinations can be made.

For this work we used a JEOL JEM 201 OF field emission STEM/TEM. The sample was grown by molecular beam epitaxy in order to achieve vertical self-ordering of Cd rich quasi-2D platelet This sample comprises 8 sequences of 10 ML (2.83 nm)Zn0.9Mn0.1Se cladding layer and 0.3 ML (0.09 nm) CdSe sheet, a further 10 ML of Zn0.9Mn0.1Se, and a 50 nm ZnSe capping layer.

Type
Quantitative STEM: Imaging and EELS Analysis Honoring the Contributions of John Silcox (Organized by P. Batson, C. Chen and D. Muller)
Information
Microscopy and Microanalysis , Volume 7 , Issue S2: Proceedings: Microscopy & Microanalysis 2001, Microscopy Society of America 59th Annual Meeting, Microbeam Analysis Society 35th Annual Meeting, Long Beach, California August 5-9, 2001 , August 2001 , pp. 202 - 203
Copyright
Copyright © Microscopy Society of America 2001

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References

references

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6 This work was sponsored by NSF grants # DMR-9733895 and # DMR 0072897Google Scholar