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Quantification and Classification of Complex Microstructures by means of FIB/SEM-Nanotomography

Published online by Cambridge University Press:  07 September 2007

F Muecklich  and
A Velichko
F Muecklich
Affiliation:
Saarland University, Germany
A Velichko
Affiliation:
Saarland University, Germany
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Extract

Extended abstract of a paper presented at MC 2007, 33rd DGE Conference in Saarbrücken, Germany, September 2 – September 7, 2007

Type
Research Article
Information
Microscopy and Microanalysis , Volume 13 , Issue S03 , September 2007 , pp. 108 - 109
Copyright
Copyright © Microscopy Society of America 2007

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