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Polarization Screening and Image Formation in SSPM, EFM and PiezoresponseImaging of Ferroelectric BaTiO3 (100) Surface

Published online by Cambridge University Press:  02 July 2020

Sergei V. Kalinin  and
Dawn A. Bonnell
Sergei V. Kalinin
Affiliation:
Dept. Mat. Sci. Eng., University of Pennsylvania, 3231 Walnut St., Philadelphia, PA19104
Dawn A. Bonnell
Affiliation:
Dept. Mat. Sci. Eng., University of Pennsylvania, 3231 Walnut St., Philadelphia, PA19104
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Extract

Possible applications of ferroelectric materials in non-volatile memories, MEMS, microwave ceramics, PTCR devices and sensors draw significant interest to these materials. Operation of most of these devices relies heavily on the surface (FRAM and other thin-film devices) and interface (PTCR, varistors) properties of ferroeiectrics, particularly on the polarization and charge distribution in the surface or interface region. Electrostatic scanning probe techniques such as electrostatic force microscopy (EFM), scanning surface potential microscopy (SSPM) and piezoresponse imaging (PRI) can be successfully employed for the characterization of ferroelectric surfaces on the micron and submicron level. The former technique is based on the detection of the resonant frequency shift of mechanically driven cantilever, which is proportional to gradient of electrostatic force acting on the tip. The latter two techniques are based on the voltage modulation approach, i.e. during imaging the piezoelectric actuator driving the cantilever is disengaged and the AC bias is applied directly to conductive tip.

Type
Scanned Probe Microscopy
Information
Microscopy and Microanalysis , Volume 6 , Issue S2: Proceedings: Microscopy & Microanalysis 2000, Microscopy Society of America 58th Annual Meeting, Microbeam Analysis Society 34th Annual Meeting, Microscopical Society of Canada/Societe de Microscopie de Canada 27th Annual Meeting, Philadelphia, Pennsylvania August 13-17, 2000 , August 2000 , pp. 706 - 707
Copyright
Copyright © Microscopy Society of America

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References

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