Hostname: page-component-586b7cd67f-r5fsc Total loading time: 0 Render date: 2024-11-27T03:53:31.234Z Has data issue: false hasContentIssue false

On the φ(ρz) Curves of Heterogeneous Materials

Published online by Cambridge University Press:  02 July 2020

Raynald Gauvin
Affiliation:
Département de génie mécanique, Université de Sherbrooke, Sherbrooke, Québec, CanadaJ1K2R1.
Eric Lifshin
Affiliation:
General Electric Corporate Research and Development Center, Schenectady, NY12301.
Get access

Extract

Quantitative X-Ray microanalysis is a well established technique for the chemical analysis of homogeneous materials having a flat surface. Precision better than 2% can be routinely obtained if the analysis is performed used the so called ZAF where standards of known composition must be used for all the elements presents in the system under analysis. However, real materials have generally different phases and their composition in a specific phase is not necessary homogeneous. Also, real materials may have surfaces that are not flat and where it is inappropriate to polish them, like a fractured or a corroded surface. It is therefore of paramount importance to develop quantitative schemes for such materials. The first step is to understand the shape of the φ(ρz) curves of heterogeneous materials. This paper present some of these curves that have been obtained with the Monte Carlo program CASINO available for free at www.gme.usherb.ca/casino.

Type
Mas Celebrates: Fifty Years of Electron Probe Microanalysis
Copyright
Copyright © Microscopy Society of America

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1.Hovington, P., Drouin, D. et Gauvin, R. (1997), Scanning, Vol.19, pp. 114, pp.20-28 andpp.29-35.CrossRefGoogle Scholar
2.Gauvin, R.et.al (1996), Microscopy & Microanalysis, pp. 494495.Google Scholar
3.Gauvin, R., Hovington, P. et Drouin, D. (1995), Scanning, Vol. 17, pp. 202219.CrossRefGoogle Scholar
4.Gauvin, R. (1998), Microscopy & Microanalysis, Vol. 4, Supp. 2, pp. 206207.Google Scholar