Hostname: page-component-586b7cd67f-tf8b9 Total loading time: 0 Render date: 2024-11-26T04:20:36.799Z Has data issue: false hasContentIssue false

On the Contrast of Precipitates Observed with a FE-SEM

Published online by Cambridge University Press:  02 July 2020

Raynald Gauvin
Affiliation:
Département de Génie mécanique, Université de Sherbrooke, Sherbrooke, Québec, CANADAJ1K 2R1.
Pierre Hovington
Affiliation:
Centre de Recherche de 1’Hydro-Québec, Varennes, Québec, CANADAJ3X 1S1
Get access

Extract

It has been shown recently that precipitates as small as 10 nm can be imaged with a FE-SEM using a Through-The-Lens (TTL) SE detector or the so-called Upper Detector (UD). This is a very significant finding because normally, such small precipitates are observed in the TEM where specimen preparation techniques are generally a timely process. However, from Monte Carlo simulations using CASINO, it has been shown that NbC precipitates embedded in Fe as small than 6 nm can be imaged with BE. The experimental demonstration was difficult because no good BSE detectors were available at that time for low energy work.

Recently, a new BSE detector has been developed for low energy work from the GW corporation, the Centaurus BSE detector. This detector is coupled with an HITACHI S-4700 FESEM In this work, images of Mg2Zn precipitates in Al obtained with the UD and the Centaurus BSE detector are compared.

Type
Low Voltage (1-5 kv) X-ray Microanalysis
Copyright
Copyright © Microscopy Society of America

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

references

1.Gauvin, R. et Yue, S. (1997), Microscopy & Microanalysis, Vol. 3, Supp. 2, pp. 12431244.CrossRefGoogle Scholar
2.Gauvin, R., Hovington, P., et Drouin, D. (1997), Scanning,Vol. 19, pp. 114.Google Scholar
3.Reimer, L. (1998), Scanning Electron Microscopy, Springier-Verlag, New York, p 160.CrossRefGoogle Scholar
4. Centauraus is a trademark of GW Corporation.Google Scholar