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Observing Impurity Doping in Oxide Grain Boundaries Using STEM

Published online by Cambridge University Press:  31 July 2006

JP Buban ,
Y Sato ,
K Matsunaga ,
N Shibata ,
T Yamamoto  and
Y Ikuhara
JP Buban
Affiliation:
University of Tokyo,Japan
Y Sato
Affiliation:
University of Tokyo,Japan
K Matsunaga
Affiliation:
University of Tokyo,Japan
N Shibata
Affiliation:
University of Tokyo,Japan
T Yamamoto
Affiliation:
University of Tokyo,Japan
Y Ikuhara
Affiliation:
University of Tokyo,Japan
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Extract

Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

Type
Research Article
Information
Microscopy and Microanalysis , Volume 12 , Issue S02 , August 2006 , pp. 138 - 139
Copyright
© 2006 Microscopy Society of America

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