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Observation of Ordered Ti3Al5 Precipitates in Slightly Aluminum Rich γ-TiAl

Published online by Cambridge University Press:  02 July 2020

S. Jayanthi ,
J.M.K. Wiezorek ,
S. Swaminathan  and
H.L. Fraser
S. Jayanthi
Affiliation:
Department of Materials Science and Engineering, The Ohio State University, Columbus, OH;
J.M.K. Wiezorek
Affiliation:
Department of Materials Science and Engineering, The Ohio State University, Columbus, OH;
S. Swaminathan
Affiliation:
Department of Materials Science and Engineering, North Carolina StateUniversity, Raleigh, NC;
H.L. Fraser
Affiliation:
Department of Materials Science and Engineering, The Ohio State University, Columbus, OH;
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It is the accepted wisdom that off-stoichiometric TiAl alloys with slightly Aluminum rich compositions, e.g. Ti-52 at.% Al and Ti-54 at.% Al, exist as single phase materials. However, previous studies have reported that Ti3Al5 ordering occurs in Al rich γ-TiAl of compositions 54-63 at.% Al [1,2]. The Ti3Al5 ordering involves the substitution of excess Al into selected Ti sites on the pure Ti plane (001) [1]. In the current work such Ti3Al5 ordering has been observed in TiAl alloys of compositions ranging from Ti-52 at.% Al to Ti-56 at.% Al which have been produced as described in earlier reports [e.g. 3].

Experimental and simulated selected area diffraction patterns (SAD) for the [111] zone axis of TiAl are shown in figure 1. A row of extra reflections which appears between the reflections corresponding to the Ll0 structure are clearly visible in the diffraction patterns obtained from the Ti-54 and 56 at.% Al alloys (Fig. 1b,1c).

Type
Phase Transformations in Metals and Alloys
Information
Microscopy and Microanalysis , Volume 3 , Issue S2: Proceedings: Microscopy & Microanalysis '97, Microscopy Society of America 55th Annual Meeting, Microbeam Analysis Society 31st Annual Meeting, Histochemical Society 48th Annual Meeting, Cleveland, Ohio, August 10-14, 1997 , August 1997 , pp. 699 - 700
Copyright
Copyright © Microscopy Society of America 1997

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References

1.Nakano, T., Matsumo, K., Seno, T., Oma, K. and Umakoshi, Y., Phil. Mag. A74,251–268 (1996).10.1080/01418619608239700CrossRefGoogle Scholar
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3.Swaminathan, S., Jones, I.P., Zaluzec, N.J., Maher, D.M. and Fraser, H.L., Mat. Sci. Eng A, 170, 227 (1993)10.1016/0921-5093(93)90383-PCrossRefGoogle Scholar
4. Support for this work from the National Science Foundation with Dr. MacDonald, Bruce as program manager is gratefully acknowledged.Google Scholar