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Novel double-wedge sample preparation technique for quantitative TEM analysis of 3D structure in thin films and at buried interfaces

Published online by Cambridge University Press:  07 September 2007

E Spiecker ,
V Radmilovic  and
U Dahmen
E Spiecker
Affiliation:
Christian-Albrechts-University Kiel, Germany and Lawrence Berkeley National Laboratory,USA
V Radmilovic
Affiliation:
Lawrence Berkeley National Laboratory,USA
U Dahmen
Affiliation:
Lawrence Berkeley National Laboratory,USA
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Extract

Extended abstract of a paper presented at MC 2007, 33rd DGE Conference in Saarbrücken, Germany, September 2 – September 7, 2007

Type
Research Article
Information
Microscopy and Microanalysis , Volume 13 , Issue S03 , September 2007 , pp. 92 - 93
Copyright
Copyright © Microscopy Society of America 2007

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