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Noise Level in Electron Holograms: The Impact of CCD Camera- and Hologram Reconstruction Parameters

Published online by Cambridge University Press:  05 August 2007

E Voelkl ,
PE Mooney ,
J Niehus  and
R Gauvin
E Voelkl
Affiliation:
FEI Company
PE Mooney
Affiliation:
Gatan,Inc
J Niehus
Affiliation:
Gatan,Inc
R Gauvin
Affiliation:
McGill University,Canada
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Extract

Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Type
Research Article
Information
Microscopy and Microanalysis , Volume 13 , Issue S02 , August 2007 , pp. 138 - 139
Copyright
© 2007 Microscopy Society of America

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