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A New Solid-State Detector and Counting System for Wavelength Dispersive Spectrometers

Published online by Cambridge University Press:  03 August 2008

D Lesher ,
Y Diawara ,
S Medved  and
R Durst
D Lesher
Affiliation:
Advanced MicroBeam Inc
Y Diawara
Affiliation:
Bruker AXS Inc
S Medved
Affiliation:
Bruker AXS Inc
R Durst
Affiliation:
Bruker AXS Inc
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Extract

Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Type
Research Article
Information
Microscopy and Microanalysis , Volume 14 , Supplement S2 , August 2008 , pp. 1160 - 1161
Copyright
© 2008 Microscopy Society of America

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